Skip to content
EC-302 · Electronic Measurements and Instrumentation/Quick Revision Short Notes

Electronic Measurements and Instrumentation (EC-302) - Unit 4 Short Notes

UNIT 4: ELECTRONIC MEASUREMENTS AND INSTRUMENTATION

I. FUNDAMENTALS OF MEASUREMENT & INSTRUMENT CHARACTERISTICS

Static Characteristics

Accuracy is the closeness of agreement between a measured value and the true value. Precision is the repeatability or reproducibility of measurements (closeness among individual readings). A system can be precise but inaccurate (consistent error) or accurate but imprecise (scattered readings).

Resolution is the smallest change in input signal that produces a detectable change in output. For a digital instrument, it's the value of the least significant bit (LSB).

[!TIP] Exam Distinction: Accuracy → True value; Precision → Consistency among readings. High precision does NOT guarantee high accuracy.

Term Definition Formula/Note
Sensitivity Ratio of output change to input change. $$\displaystyle S = \frac{\Delta \text{Output}}{\Delta \text{Input}} $$
Scale Span The range of the instrument from minimum to maximum measurable value.
Linearity The degree to which the calibration curve deviates from a straight line.
Hysteresis Difference in output for the same input depending on whether input is increasing or decreasing.
Threshold Minimum input required to produce a detectable output change.
Drift Gradual change in output over time for a constant input.

Static Error ($$\displaystyle e_s $$) = Measured Value - True Value. Static Correction ($$\displaystyle c_s $$) = - $$\displaystyle e_s $$ (value to be added to measured value). Relative Error ($$\displaystyle \epsilon_r $$) = $$\displaystyle \frac{e_s}{\text{True Value}} $$. Percentage Relative Error ($$\displaystyle \%\epsilon_r $$) = $$\displaystyle \frac{e_s}{\text{True Value}} \times 100\% $$.

[!TIP] Common Pitfall: Relative error is a more meaningful quality indicator than absolute error for comparing instruments of different ranges.

Types of Errors:

  1. Gross Errors: Human mistakes, reading errors.

  2. Systematic Errors: Instrumental (calibration), environmental (temperature), observational.

  3. Random Errors: Unpredictable fluctuations (noise).

Calibration is the process of comparing an instrument's output against a known standard to determine and correct its error. It's essential to minimize systematic errors and maintain accuracy over time.

Dynamic Characteristics & Response

Describes how an instrument responds to time-varying inputs. Key parameter is time constant (τ) for first-order systems.

Damping Ratio (ζ):

  • Under-damped (ζ < 1): Oscillatory response before settling.

  • Over-damped (ζ > 1): Slow, sluggish response without oscillation.

  • Critically damped (ζ = 1): Fastest response without overshoot.

[!TIP] Why Slightly Under-damped? (JUN 2024, JUN 2023) It provides a faster time to first indication than critically damped, with a manageable, small overshoot. It's a trade-off between speed and stability.

Standard Test Inputs & Response:

  1. Step Input: Sudden change. Tests speed of response, overshoot, settling time.

  2. Ramp Input: Linear increase. Tests tracking ability, lag error.

  3. Sine Input: Periodic. Tests frequency response (magnitude & phase).

  4. Impulse Input: Very short pulse. Tests system's natural frequency and damping.


II. ANALOG & DIGITAL VOLTMETERS

DC Voltmeters

1. Chopper Type DC Voltmeter (JUN 2025)

  • Principle: Converts DC input into an AC signal using a chopper (modulator), amplifies the AC signal with a high-gain AC amplifier (avoiding DC drift issues), then demodulates back to DC.

  • Working: Input DC → Chopper (mechanical/electronic switch) → Modulated AC → High-gain AC Amplifier → Demodulator (detector) → Filtered DC Output → Meter.

  • Advantage: High sensitivity and stability, as only AC amplification is used (no DC drift in amplifier).

2. Electrostatic Voltmeter (Attracted Plate Type) (JUN 2023 problem)

  • Principle: Based on electrostatic force between two charged plates. Force $$\displaystyle F \propto V^2 $$.

  • Construction: Fixed plate (guard ring) & movable plate. Applied voltage creates attraction, moving the plate against spring tension. Deflection is proportional to $$\displaystyle V^2 $$.

  • Applications: High voltage measurement (kV range), high impedance circuits (very low loading effect).

AC Voltmeters

Types:

  • Average-responding (with diode + capacitor filter): Rectifies AC, measures average value, calibrated to read RMS for sine waves only ($$\displaystyle V_{rms} = 1.11 \times V_{avg} $$ for sine).

  • True RMS-responding: Uses thermal or electronic conversion (e.g., square-law device, converter IC) to measure heating value directly. Reads RMS correctly for any waveform.

  • Peak-responding: Uses a peak detector circuit. Holds peak value; may include a sample-and-hold.

Digital Voltmeters (DVM)

Principle: Convert analog voltage to digital code using an ADC and display numerically.

Digits & Resolution (JUN 2025, JUN 2023, DEC 2023):

  • A 3½ digit DVM can display 3 full digits (0-9) and a ½ digit (usually 0 or 1).

  • Resolution = $$\displaystyle \frac{1}{\text{Full Scale Range} \times 10^{\text{(number of full digits)}}} $$.

    • Example: 10V range on a 3½ digit DVM (3 full digits) → Resolution = $$\displaystyle \frac{1}{10V \times 10^3} = 1mV $$.
  • Significance of ½ digit: It indicates the maximum possible first digit (over-range capability). A ½ digit can only be 0 or 1, so the maximum reading is 1999 counts (for a 3½ digit). It defines the counts or overflow point.

Sensitivity: Smallest change in input voltage that causes a one-count change in display. For a 3½ digit, 10V range: Sensitivity = 1mV.

Types of DVMs (ADCs)

1. Dual Slope Integrating Type ADC (DEC 2024)

  • Block Diagram: Input → Integrator → Comparator → Control Logic → Counter & Clock → Digital Output.

  • Working:

    • Phase 1 (Fixed time $$\displaystyle T_1 $$): Input voltage $$\displaystyle V_i $$ integrated. Output slope $$\displaystyle \propto V_i $$.

    • Phase 2 (Variable time $$\displaystyle T_2 $$): Reference voltage $$\displaystyle -V_{ref} $$ integrated. Output slope $$\displaystyle \propto -V_{ref} $$. Counter counts until integrator output returns to zero.

    • Result: $$\displaystyle T_2 \propto V_i $$. Digital output = Count in $$\displaystyle T_2 $$.

  • Advantages: High noise rejection (integrates input), high accuracy, cost-effective.

2. Successive Approximation ADC (SAR) (JUN 2025, JUN 2023, NOV 2022)

  • Block Diagram: Sample & Hold → Comparator → Successive Approximation Register (SAR) → DAC → Digital Output.

  • Working: SAR starts with MSB=1, others=0. DAC output compared to input. If DAC < input, bit is retained; else, reset. Proceeds to next bit (MSB-1). n-bit conversion takes exactly n clock cycles.

  • Conversion Time: $$\displaystyle T_{conv} = n \times T_{clock} $$.

3. Simultaneous (Flash) Type ADC (JUN 2024)

  • Principle: Uses $$\displaystyle 2^n - 1 $$ comparators for n-bit conversion. Each comparator compares input with a reference from a resistor ladder.

  • Conversion Logic: Priority encoder converts the highest-order active comparator's output to binary code.

  • Advantage: Fastest conversion (propagation delay only).

  • Disadvantage: Exponential increase in comparators with bits (cost, power).

4. Counter Type ADC (NOV 2022)

  • Working: Simple up-counter drives a DAC. Comparator output controls counter clock enable. Counter increments until DAC output ≈ input. Slow (max $$\displaystyle 2^n $$ clock cycles).

Comparison of ADC Types (Clock Pulses Required):

ADC Type Clock Pulses per Conversion Speed Complexity
Counter Up to $$\displaystyle 2^n $$ Very Slow Low
Successive Approx. Exactly n Medium Medium
Flash 1 (parallel) Very Fast Very High
Dual Slope Fixed $$\displaystyle T_1 $$ + Variable $$\displaystyle T_2 $$ Slow Low

III. CATHODE RAY OSCILLOSCOPE (CRO) & SPECIAL PURPOSE OSCILLOSCOPES

General Purpose CRO

Block Diagram:


[Vertical Amplifier] → [Delay Line] → [Horizontal Amplifier]

         ↑                      ↓

[Probe]      [Trigger Circuit]      [Time Base Generator (Sweep)]

         ↓                      ↑

[CRT (Display)] ← [Horizontal Deflection] ← [Sweep Signal]

CRT Construction:

  1. Electron Gun: Cathode (heated emitter) → Control Grid (intensity control) → Focusing Anode (electrostatic/electromagnetic) → Accelerating Anode.

  2. Deflection System: Electrostatic (plates) for most CROs. Electromagnetic (yokes) for TV/monitors.

  3. Fluorescent Screen: Converts electron beam energy to visible light (phosphor).

Electrostatic Focusing & Deflection:

  • Focusing: Voltage on focusing anode creates electrostatic field that converges electron beam to a fine spot.

  • Deflection: Voltage on Y-plates moves beam vertically; voltage on X-plates moves beam horizontally.

Probes (DEC 2023):

  • Importance: Isolate CRO from circuit, minimize loading (capacitance/resistance), protect CRO.

  • Types: 1:1 (direct), 10:1 (most common).

  • 10:1 Probe Circuit: Series resistor (9MΩ) in probe, parallel capacitor (compensation capacitor) matches scope input capacitance (≈20pF). Creates 10:1 voltage divider, reduces loading.

Graticules (DEC 2023): Grid lines on CRT face for measurement. Typically 1cm x 1cm grid with finer subdivisions (e.g., 0.2cm).

Special Purpose CROs

1. Dual Beam vs. Dual Trace CRO (DEC 2023, DEC 2024)

Feature Dual Beam CRO Dual Trace CRO
Beams Two separate electron guns & CRTs (or one CRT with two guns). Single gun, rapid chopping or alternate switching of beam.
Simultaneity True simultaneous display. Not simultaneous (time-multiplexed).
Bandwidth Higher (no chopping limitation). Lower in chop mode (switching frequency limit).
Complexity More complex, expensive. Simpler, common.

2. Dual Trace CRO Operation (JUN 2025, NOV 2022)

  • Chopping Mode: Fast electronic switch (≈1MHz) alternately connects channel A and B to vertical amplifier. Suitable for low-frequency signals.

  • Alternate Mode: Sweep completes for channel A, then for channel B. Suitable for high-frequency signals.

  • Circuit: Electronic switch (e.g., FETs) controlled by gate signal from time base.

3. Sampling Oscilloscope (DEC 2024, NOV 2022)

  • Principle: For very high-frequency signals (>1GHz) beyond direct amplifier bandwidth. Takes one sample per trigger from successive cycles, builds up waveform slowly.

  • Circuit: Sample-and-hold circuit, strobe pulse (very narrow, synchronized to input), storage (e.g., CRT with long-persistence phosphor or digital memory). Effective bandwidth determined by sampling rate, not amplifier.

4. Digital Storage Oscilloscope (DSO) (JUN 2025, DEC 2024)

  • Block Diagram: Probe → Vertical Amplifier & ADC → Memory (FIFO/Block) → Microprocessor/Controller → Display (LCD). Trigger circuit controls sampling start.

  • Working: Analog signal sampled at high rate, digitized, stored in memory. Digital signal processing (FFT, measurements) possible. Waveform can be stored/recalled indefinitely.

Applications of CRO:

  • Voltage/time waveform display.

  • Frequency & phase measurement (using Lissajous patterns).

  • Timing measurements (rise time, pulse width).

  • Debugging digital circuits (logic analyzer mode).

  • Displaying characteristics (e.g., transistor curves with curve tracer).


IV. BRIDGE CIRCUITS FOR IMPEDANCE MEASUREMENT

AC Bridges - General

Balance Condition: $$\displaystyle Z_1 Z_4 = Z_2 Z_3 $$ (product of opposite arms). In polar form: $$\displaystyle |Z_1||Z_4| = |Z_2||Z_3| $$ and $$\displaystyle \angle Z_1 + \angle Z_4 = \angle Z_2 + \angle Z_3 $$. Bridge Sensitivity: Deflection of detector (e.g., galvanometer) per unit change in unknown parameter. Maximum sensitivity occurs when bridge is balanced and detector impedance is matched to bridge arms. For a detector with resistance $$\displaystyle R_g $$, sensitivity max when $$\displaystyle R_g = \sqrt{R_2 R_3} $$ (for simple resistive bridges).

Detectors for AC Bridges:

  • Tuned phones: For audio frequency, sensitive at resonance.

  • VTVM (Vacuum Tube Voltmeter): Broadband, sensitive.

  • CRO: Visual, wide frequency range.

Specific Bridges

1. Wien Bridge (JUN 2024, DEC 2024)

  • Use: Frequency measurement in audio range (20Hz-20kHz), also used in RC oscillators.

  • Circuit: Series RC ($$\displaystyle R_1, C_1 $$) in one arm, parallel RC ($$\displaystyle R_2, C_2 $$) in adjacent arm. Other two arms are pure resistors ($$\displaystyle R_3, R_4 $$).

  • Balance Equations:

$$R_4 = \frac{R_1}{R_2} R_3 \quad \text{and} \quad C_4 = \frac{C_1 R_2}{R_1}$$

For **frequency measurement**, set $$\displaystyle R_1 = R_2 = R $$, $$\displaystyle C_1 = C_2 = C $$. Then balance occurs when:

$$f = \frac{1}{2\pi RC}$$

At balance, detector shows null.

2. Schering Bridge (JUN 2025, JUN 2024, DEC 2023)

  • Use: Measurement of unknown capacitance and dissipation factor (tan δ) of capacitors and insulators.

  • Circuit: Unknown $$\displaystyle C_x $$ (with loss $$\displaystyle R_x $$) in one arm. Known capacitor $$\displaystyle C_3 $$ in adjacent arm. Two resistors $$\displaystyle R_1, R_2 $$ (or $$\displaystyle R_1, R_2, C_2 $$) in other arms.

  • Balance Equations:

$$C_x = \frac{C_3 R_1}{R_2}, \quad R_x = \frac{C_2 R_2}{C_3}$$

Dissipation factor $$\displaystyle \tan \delta = \frac{1}{\omega R_x C_x} = \omega C_2 R_2 $$.
  • Operation: Adjust $$\displaystyle R_1 $$ and $$\displaystyle C_2 $$ (or $$\displaystyle R_2 $$) for null.

3. Hay's Bridge (JUN 2025, DEC 2024, JUN 2023)

  • Use: Measurement of inductance with high Q factor (Q > 10).

  • Circuit: Unknown $$\displaystyle L_x $$ (with series resistance $$\displaystyle R_x $$) in one arm. Known capacitor $$\displaystyle C_4 $$ in adjacent arm. Resistors $$\displaystyle R_1, R_2, R_3 $$ in other arms.

  • Balance Equations:

$$L_x = \frac{R_2 R_3}{2\pi f C_4 R_1}, \quad R_x = \frac{R_2 R_3}{R_1}$$

*Note:* $$\displaystyle R_1 $$ is the series resistance of the inductor arm. Bridge gives **series equivalent** of coil.

4. Maxwell's Inductance Capacitance Bridge (DEC 2023)

  • Use: Measurement of inductance (medium Q).

  • Limitation for High Q Coils: Balance condition involves $$\displaystyle R_2 $$ (known resistor) and $$\displaystyle R_4 $$ (variable standard resistor). For high Q ($$\displaystyle \omega L_x \gg R_x $$), $$\displaystyle R_4 $$ becomes very large and difficult to obtain accurately.

Q-Meter

Principle: Series resonant circuit. At resonance, $$\displaystyle X_L = X_C $$, voltage across capacitor $$\displaystyle V_C = Q \times V_{source} $$. By measuring $$\displaystyle V_C $$ (with voltmeter calibrated in Q), Q-factor is found. Circuit: Coil under test $$\displaystyle L_x $$ with $$\displaystyle R_x $$ in series with a known capacitor $C$ and a source $$\displaystyle V_{source} $$. Voltmeter across $C$.

Impedance Measurement by Q-Meter:

  1. Q Measurement: Adjust $C$ to resonance (max $$\displaystyle V_C $$), read Q.

  2. Inductance $$\displaystyle L_x $$: From resonance frequency $$\displaystyle f_0 = \frac{1}{2\pi \sqrt{L_x C}} $$.

  3. Effective Resistance $$\displaystyle R_x $$: $$\displaystyle R_x = \frac{2\pi f_0 L_x}{Q} $$.

"Parallel-connection" Method (JUN 2024, NOV 2022):

  • Coil is connected in parallel with a known capacitor $$\displaystyle C_n $$ and a small known resistor $$\displaystyle R_n $$.

  • Expressions:

$$R_p = \frac{R_n Q^2}{Q^2 + 1}, \quad X_p = \frac{R_n Q}{\sqrt{Q^2 + 1}}, \quad Q = \frac{X_p}{R_p}$$

Where $$\displaystyle R_p, X_p $$ are the parallel equivalent resistance and reactance of the coil.

V. TRANSDUCERS

Introduction

Transducer: A device that converts a physical quantity (non-electrical) into an electrical signal (or vice versa). Classification (JUN 2025, DEC 2023):

  • Active/Primary: Self-generating (e.g., Thermocouple, Piezoelectric).

  • Passive/Secondary: Requires external power (e.g., Strain gauge, LVDT, Thermistor).

  • Analog/Digital.

  • Input/Output: Displacement, force, temperature, light → Electrical.

Electromagnetic Transducers

LVDT - Linear Variable Differential Transformer (DEC 2024, JUN 2024, JUN 2023)

  • Construction: Primary winding (center), two identical secondary windings (series opposing). Movable ferromagnetic core.

  • Working: AC excitation to primary. Core position determines coupling to secondaries.

    • Null Position: EMFs in secondaries equal & opposite → $$\displaystyle V_{out}=0 $$.

    • Displacement Right/Left: EMFs unequal → $$\displaystyle V_{out} \neq 0 $$. Phase indicates direction.

  • Output vs Displacement: Linear over small range around null. Infinite resolution theoretically.

  • Advantages: Non-contact, infinite resolution, rugged, linear.

Piezoelectric Transducers (DEC 2024)

  • Principle: Piezoelectric effect (direct): Certain crystals (Quartz, Rochelle salt, PZT) generate charge on surfaces when mechanically stressed.

  • Modes of Operation:

    • Thickness Mode: Stress applied perpendicular to faces (common).

    • Length Mode: Stress along length.

    • Shear Mode: Stress tangential.

  • Equivalent Circuit: Charge source $q$ in parallel with capacitor $$\displaystyle C_p $$ (crystal capacitance) and resistor $$\displaystyle R_p $$ (leakage).

  • Applications: Accelerometers (mass on crystal → force ∝ acceleration), pressure sensors, microphones, buzzers.

  • Definitions:

    • Binders: Crystals that generate charge when compressed (e.g., Quartz).

    • Twisters: Crystals that generate charge when twisted (shear mode).

Optical Transducers (DEC 2023, JUN 2024)

Type Principle Output Example
Photoemissive Electron emission from cathode when light strikes (photoelectric effect). Photocurrent. Phototube, Photomultiplier Tube (PMT).
Photoconductive Material conductivity increases with light intensity. Decrease in resistance. Photoresistor (LDR), Photodiode (reverse bias).
Photovoltaic Light generates voltage across a PN junction (no bias). Voltage/Current. Solar cell, Photodiode (zero bias).

Photodiode (DEC 2024, NOV 2022):

  • Construction: PN junction with transparent window.

  • Working (Reverse Bias): Photocurrent ∝ light intensity. Fast response.

  • Phototransistor: Photodiode base current controls transistor current → higher gain, slower.

Thermal Transducers

Thermistor (JUN 2024, NOV 2022):

  • Definition: Temperature-sensitive resistor (semiconductor). NTC (Negative Temp Coeff) most common: Resistance ↓ with Temp ↑.

  • Importance: High sensitivity (large ΔR/ΔT), small size, low cost.

  • Advantages: High sensitivity, fast response (small size), low cost.

  • Disadvantages: Non-linear, self-heating, limited temperature range.

  • Applications: Temperature measurement/compensation, inrush current limiter, temperature compensation in bridges.

Thermocouple (JUN 2025):

  • Principle: Seebeck effect: Two dissimilar metals joined at two junctions produce a voltage proportional to temperature difference between junctions.

  • Cold Junction Compensation: Reference junction must be at known temperature (often 0°C ice bath or electronic compensation).

Bolometer (NOV 2022):

  • Principle: Absorption of radiation (IR, microwave) causes heating → change in resistance of a material (e.g., thermistor or thin metal film).

  • Use: Power measurement, radiation detection.

Display & Output Transducers

1. LED - Light Emitting Diode (JUN 2025)

  • Principle: Electroluminescence. Forward biased PN junction, electrons & holes recombine in active region, emitting light (color depends on bandgap).

  • Construction: PN junction, often with epoxy lens.

  • Applications: Indicator lamps, 7-segment displays, IR emitters, traffic lights.

2. LCD - Liquid Crystal Display (JUN 2025, DEC 2024, DEC 2023)

  • Working Principle: Liquid crystals (nematic) twist polarized light. Twisted Nematic (TN) type: Alignment layers at 90°. Without field, crystals twist light 90° → light passes through second polarizer (bright). With field, crystals align → no twist → light blocked (dark).

  • Types: TN, STN (Super Twisted Nematic), TFT (Active Matrix).

  • Advantages: Low power consumption, no self-emission (good for battery), wide viewing angle (TFT), no geometric distortion.

  • Disadvantages: Slow response (ms), limited temperature range, needs backlight (passive), viewing angle dependent (TN).

Classification of Display Devices:

  • LED: Active (emits light), high brightness, fast, high power.

  • LCD: Passive (modulates light), low power, needs backlight, slower.


VI. SIGNAL GENERATORS & WAVEFORM GENERATORS

Sweep Frequency Generator (AF/RC Oscillator) (JUN 2025, DEC 2023)

  • Block Diagram: RC Oscillator (Wein Bridge or Phase Shift) → Voltage-Controlled Oscillator (VCO) or Variable RC → Sweep Circuit (ramp generator) → Output Amplifier & Attenuator.

  • Working Principle: Generates a sinusoidal output whose frequency varies smoothly and continuously over a specified range (e.g., 20Hz-20kHz). Sweep rate controlled by a ramp voltage applied to VCO or by mechanically varying RC components.

  • Applications: Frequency response testing of amplifiers/filters, Bode plotter.

Pulse/Function Generators (DEC 2024)

  • Pulse Wave Generator Block Diagram: Time Base (ramp/step) → Voltage-Controlled Switch → Multivibrator (monostable/astable) → Pulse Shaping → Output Amplifier.

  • Working: A ramp or step voltage controls the switching point of a multivibrator, determining pulse width and repetition rate. Can generate square waves, pulses with variable duty cycle.


VII. DIGITAL-TO-ANALOG CONVERTERS (DAC)

Weighted Resistor DAC (DEC 2023, NOV 2022)

  • Circuit (4-bit): Digital inputs $$\displaystyle D_3...D_0 $$ control switches to resistors $R, 2R, 4R, 8R$ (weighted). All resistors connect to summing junction of op-amp.

  • Output Voltage Equation:

$$V_o = -\frac{V_{ref}}{R} \left( \frac{D_3}{2} + \frac{D_2}{4} + \frac{D_1}{8} + \frac{D_0}{16} \right) R$$

Simplifies to: $$\displaystyle V_o = -V_{ref} \left( \frac{D_3}{2} + \frac{D_2}{4} + \frac{D_1}{8} + \frac{D_0}{16} \right) $$
  • Transfer Characteristic: Staircase. Step size (LSB) = $$\displaystyle \frac{V_{ref}}{2^n} $$.

  • Disadvantage: Requires precision resistors with exact binary ratios (hard for high bits).

R-2R Ladder DAC (JUN 2025, DEC 2024, JUN 2024, NOV 2022)

  • Circuit (4-bit): Ladder of R and 2R resistors. Each bit controls a switch to either $$\displaystyle V_{ref} $$ or ground at a ladder node.

  • Working Principle: Uses Thevenin equivalence. Each bit sees equivalent resistance of 2R looking into the ladder, simplifying analysis.

  • Output Voltage (for n-bit, $$\displaystyle V_{ref} $$ positive for '1'):

$$V_o = V_{ref} \left( \frac{D_{n-1}}{2} + \frac{D_{n-2}}{4} + ... + \frac{D_0}{2^n} \right)$$

  • Advantage: Only two resistor values (R and 2R) needed, easy to fabricate with good matching.

  • Calculation Example (DEC 2024):

    • Step size (LSB) = $$\displaystyle \frac{V_{ref}}{2^n} = \frac{5V}{16} = 0.3125V $$.

    • Input 0111 (binary 7): $$\displaystyle V_o = 5 \times (0 + \frac{1}{4} + \frac{1}{8} + \frac{1}{16}) = 5 \times 0.4375 = 2.1875V $$.

    • Input 1111 (binary 15): $$\displaystyle V_o = 5 \times (0.5+0.25+0.125+0.0625) = 5 \times 0.9375 = 4.6875V $$.


VIII. ANALOG-TO-DIGITAL CONVERTERS (ADC)

Successive Approximation ADC (SAR) (JUN 2025, JUN 2023, NOV 2022)

  • Block Diagram: Sample & Hold → Comparator → SAR (Logic) → DAC → Digital Output.

  • Detailed Operation:

    1. Sample input $$\displaystyle V_i $$ (S/H holds).

    2. SAR sets MSB=1, others=0. DAC gives $$\displaystyle V_{DAC} = V_{ref}/2 $$.

    3. Compare $$\displaystyle V_{DAC} $$ with $$\displaystyle V_i $$.

      • If $$\displaystyle V_{DAC} < V_i $$: Keep MSB=1.

      • If $$\displaystyle V_{DAC} > V_i $$: Reset MSB=0.

    4. Set next bit (MSB-1) to 1, repeat comparison.

    5. Continue for all n bits.

  • Conversion Time: $$\displaystyle T_{conv} = n \times T_{clock} $$ (fixed, predictable).

Dual Slope (Integrating) ADC (DEC 2024)

  • Block Diagram: Input → Switch (to $$\displaystyle V_i $$ or $$\displaystyle -V_{ref} $$) → Integrator → Comparator → Control Logic → Counter & Clock.

  • Operation:

    • Phase 1 ($$\displaystyle T_1 $$ fixed): Integrate $$\displaystyle V_i $$ → output slope $$\displaystyle \propto V_i $$.

    • Phase 2 ($$\displaystyle T_2 $$ variable): Integrate $$\displaystyle -V_{ref} $$ → output slope $$\displaystyle \propto -V_{ref} $$. Counter counts until integrator output returns to zero.

    • Digital Output: Count in $$\displaystyle T_2 $$ ∝ $$\displaystyle V_i $$.

  • Advantages: Excellent noise rejection (integrates input), high accuracy, independent of clock frequency accuracy (only needs stable $$\displaystyle T_1 $$ and $$\displaystyle V_{ref} $$).

Flash (Simultaneous) ADC (JUN 2024)

  • Principle: $$\displaystyle 2^n - 1 $$ comparators, each with reference from resistor ladder ($$\displaystyle V_{ref}/2^n $$ steps).

  • Conversion Logic: Comparator outputs fed to priority encoder. Highest-order '1' output determines digital code.

  • Comparison: Fastest (propagation delay only), but complexity grows exponentially with bits. Used for very high-speed applications (video, radar).

Counter Type ADC (NOV 2022)

  • Simple: Up-counter drives DAC. Comparator enables counter clock until $$\displaystyle V_{DAC} \ge V_i $$.

  • Conversion Time: Up to $$\displaystyle 2^n $$ clock cycles (worst case). Slow but simple.

Resolution of ADC (DEC 2023)

  • Definition: Smallest change in input voltage that changes output code by 1 LSB.

  • Formula: $$\displaystyle \text{Resolution} = \frac{V_{FS}}{2^n} $$ or $$\displaystyle \frac{V_{FS}}{2^n - 1} $$ (for bipolar).

  • Example (DEC 2023): 5-bit ADC, range 10V.

    • Resolution = $$\displaystyle \frac{10V}{2^5} = \frac{10}{32} = 0.3125V $$.

    • Range for MSB (bit 4): 5V to 10V (since MSB weight = $$\displaystyle V_{FS}/2 $$).

    • % Error in conversion: Ideally ½ LSB max error = $$\displaystyle \frac{0.5 \times 0.3125}{10} \times 100\% = 1.5625\% $$.

Go to where you left off?

Quick Add to Notes

Save questions, your own notes and screenshots into notes filed by unit. It takes a free account.

Create free account

Have an account? Log in