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BT-106 · Manufacturing Practices/Important Questions

Manufacturing Practices (BT-106) - Important Questions

  1. Unit 57 Marks High Priority

    Explain the objectives and advantages of Statistical Process Control (SPC). Discuss how SPC helps in reducing variation and improving product quality.

    Core conceptual question on Statistical Process Control (SPC); fundamental to Unit 5 and frequently examined.

  2. Unit 514 Marks High Priority

    Draw $X$-bar and $R$ control charts for a variable characteristic. Explain how centre lines and control limits are calculated and discuss interpretation of patterns indicating out-of-control conditions.

    Standard long question requiring chart construction, interpretation and decision making; commonly asked in exams.

  3. Unit 510 Marks High Priority

    Define process capability indices $C_p$ and $C_{pk}$. State their formulae and explain the interpretation of values. Give a numerical example showing calculation of $C_p$ and $C_{pk}$ for a process with known $USL$, $LSL$, mean $\mu$ and standard deviation $\sigma$.

    Use the formulae:

    $C_p = \frac{USL - LSL}{6\sigma}$

    $C_{pk} = \min\left(\frac{USL - \mu}{3\sigma},\;\frac{\mu - LSL}{3\sigma}\right)$

    Core derivation and calculation topic: process capability indices are fundamental for quality assessment and often tested.

  4. Unit 57 Marks Medium Priority

    Differentiate between variable control charts and attribute control charts. Give typical examples of each (for example, $X$-bar, $R$, $p$, $c$ charts) and explain when each type should be used.

    Conceptual differentiation frequently examined to test understanding of chart selection.

  5. Unit 510 Marks Medium Priority

    Explain a single sampling plan for acceptance sampling by attributes. Describe the sampling parameters (sample size $n$ and acceptance number $c$) and explain how the Operating Characteristic (OC) curve is obtained for a given plan.

    Question on acceptance sampling fundamentals; single sampling plans are core and commonly asked with OC concepts.

  6. Unit 57 Marks Medium Priority

    Explain the Operating Characteristic (OC) curve for an acceptance sampling plan. Define producer's risk ($\alpha$) and consumer's risk ($\beta$) and illustrate their positions on an OC curve.

    OC curve and risks are standard topics in sampling and quality control sections of Unit 5.

  7. Unit 57 Marks Low Priority

    Describe Total Productive Maintenance (TPM). List its main pillars and explain how TPM contributes to improved manufacturing efficiency and quality.

    Maintenance strategy topic that links manufacturing uptime and quality; occasionally asked.

  8. Unit 57 Marks Medium Priority

    Give an overview of the ISO 9001 quality management system. State the key principles of a quality management system and outline the basic clause structure of ISO 9001.

    Quality management system overview question; often a short theoretical question.

  9. Unit 510 Marks Medium Priority

    Describe the Six Sigma methodology with emphasis on the DMAIC cycle. Explain the meaning of process sigma level and how sigma level relates to defects per million opportunities (DPMO) conceptually.

    Six Sigma and DMAIC are core quality improvement methodologies; conceptual and calculation aspects may be asked.

  10. Unit 57 Marks Low Priority

    Explain the purpose and steps of non-conformance reporting and the Corrective and Preventive Action (CAPA) process in a manufacturing environment.

    Quality assurance and corrective action processes are part of Unit 5 and appear as short-answer questions.

  11. Unit 510 Marks Medium Priority

    Explain Gauge Repeatability and Reproducibility (Gauge R&R). Describe the components of variation assessed in a Gauge R&R study and outline the steps to perform such a study.

    Measurement system analysis is a practical topic often tested with calculations or interpretation of results.

  12. Unit 510 Marks High Priority

    Explain $p$-chart and $c$-chart for monitoring attribute data. State the formulae for control limits and describe how to interpret points outside limits or non-random patterns.

    For example, $p$-chart control limits are given by:

    $\bar p \pm 3\sqrt{\frac{\bar p\left(1-\bar p\right)}{n}}$

    Attribute control chart formulas and usage are frequently examined; $p$-chart/$c$-chart construction is core Unit 5 material.

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